CS838 Summary
MoSys Explains 1T-SRAM Technology
Microprocessor Report, Volume 13 No. 12
1T-SRAM-Q: Quad-Density Technology Reins in Spiralling Memory Requirements
Mark-Eric Jones,
MoSys White Paper
Motivation
- ITRS Roadmap
- System On a Chip (SOC) - breakdown of logic vs. memory
- 52% mem in 2002, 71% mem in 2005, 94% mem in 2014
- Are these assumptions realistic?
- Logic vs. memory breakdown makes many assumptions about computation vs. communication ratio
- Authors are technologists, not visionaries
Goal: provide speed of SRAM, density of DRAM
- Makes DRAM look like SRAM
- Intended for systems with > 0.25 Mb memory
- Incremental size disadvantage of 6T-SRAM negligble below this point
- Two technology options:
- standard CMOS process: 2X density of 6T-SRAM
- modified CMOS process: 4X density of 6T-SRAM
Making It Fast
- Very small block size
- lower bitline & wordline capacitance => higher speed
- Multiple blocks combined into macrocell
- Also uses fast address decode logic
Hiding Refresh Latency
- Macrocell organized into banks
- 1 SRAM cache block per macrocell, same size as a bank
- Banks can be refreshed while reads to other banks are served
- Worst-case scenario: All reads go to same bank, but don't touch some rows
- Solution: refresh time of bank < time to read entire bank
- Thus, guaranteed to have a cache hit during "proper refresh period" (refresh time / # rows)
- David's question: do we care about hiding refresh latency for an on-chip L2 cache?
- Maybe- we might want deterministic hit times for aggressive scheduling
- But, refresh operations occur with known frequency, so we can account for this in scheduling
Process Technology
- Standard CMOS process: uses horizontal plate cap, defined by poly gate mask.
- Modified CMOS process: uses "Folded Area Capacitor (FAC)" - a vertical capacitor to reduce cell size
- Requires additional non-critical mask step, an additional etch step (to create trench in STI) and an additional dep step (to fill the trench with polysilicon).