Karu's Homepage |
» Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities |
| Sorted by Date | Classified by Publication Type | Classified by Research Category | Chen-Han Ho, Garret Staus, Aaron Ullmer, and Karthikeyan Sankaralingam. Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. Computer Architecture Letters, 10, 2011. Download(unavailable) Abstract(unavailable) BibTeX@article{cal11:reliability-security, author={Chen-Han Ho and Garret Staus and Aaron Ullmer and Karthikeyan Sankaralingam}, title={Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities}, journal="{Computer Architecture Letters}", year={2011}, volume={10}, numer={2}, bib_pubtype = {Journal}, bib_rescat = {Architecture}, year={2011} } Generated by bib.pl (written by Patrick Riley ) on Sat Jul 15, 2017 14:55:43 time=1207019082 |
Page last modified on April 19, 2018 |