» Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities

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Chen-Han Ho, Garret Staus, Aaron Ullmer, and Karthikeyan Sankaralingam. Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities. Computer Architecture Letters, 10, 2011.

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BibTeX

 @article{cal11:reliability-security,
   author={Chen-Han Ho and Garret Staus and Aaron Ullmer and Karthikeyan Sankaralingam},
   title={Exploring the Interaction Between Device Lifetime Reliability and Security Vulnerabilities},
   journal="{Computer Architecture Letters}",
   year={2011},
   volume={10},
   numer={2},
   bib_pubtype = {Journal},
   bib_rescat = {Architecture},
   year={2011}
 }

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